技术档案

半导体自动测试设备Semiconductor automated test equipment

自动检测芯片性能的设备

每条都摘自下方编号的来源原文；只写事实，不写预测或建议。

技术简介

SoC测试系统通过灵活配置板卡或模块，测试芯片内的逻辑、模拟、射频、直流和图像电路。4
Our SoC test systems can test all the integrated circuits in SoC devices, including logic, analog, RF, DC and imagers by flexible configuration of the cards/modules used in the test system.

Magnum 7H使用P52晶圆分选接口，该接口也用于泰瑞达的其他多个平台。3
The Magnum 7H leverages Teradyne’s P52 wafer sort interface used across multiple Teradyne platforms.
UltraFLEXplus S24是24插槽系统，同时用于工程研发和量产测试。1
The first model, UltraFLEXplus S24, is a 24-slot system built for both engineering and production use, with particular emphasis on the economics that matter most to integrated device manufacturers (IDMs) and outsourced semiconductor assembly and test (OSAT) providers.
V93000 EXA Scale是面向AI和高性能计算等应用的SoC测试系统。2
The V93000 EXA Scale SoC Test System, which offers a flexible, scalable and cost-efficient test platform that addresses the latest industry challenges and enables sophisticated applications such as AI and HPC.

Advantest称AI高性能芯片产量上升、先进封装等技术增加芯片复杂度，促使客户持续投资测试机。5
In Advantest’s business, as production volumes of AI-related high-performance semiconductors increased and semiconductor complexity grew with the adoption of advanced packaging and other technologies, customers continued to invest actively in our testers.

泰瑞达设计、开发并制造自动测试设备和先进机器人系统。1
Teradyne (NASDAQ: TER) designs, develops, and manufactures automated test equipment and advanced robotics systems.
Advantest制造用于半导体设计和生产的自动测试与测量设备，应用包括HPC、AI、汽车、工业和消费领域。2
Advantest (TSE Prime: 6857) is the leading manufacturer of automatic test and measurement equipment used in the design and production of semiconductor devices such as high-performance compute (HPC), artificial intelligence (AI), automotive, industrial and consumer applications.